Specifications
| Sizes |
4 inches to 12 inches |
| Film types |
| Diffusion furnace/CVD |
Thermal oxide films(THOX®), TEOS films, nitride films, poly-Si films, α-Si films, BPSG, and W-CVD |
| Metal films |
Al, Al-Si, Al-Cu, Al-Si-Cu, Ti, TiN, Ta, TaN, W, Cu, Cu plating, Au, etc. |
| Coating films |
Resist, polyimide (photosensitive, and nonphotosensitive), and SOG |
| Other process service
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Ion implantation, photolithography, etching, silicon wafer downsizing, grinding, polishing, and laser marking |
| Patterned wafers |
Contact holes, and TEG-patterned wafers for assessment |
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* Some wafers can not be processed depending on their sizes. For more information, please contact us.
Process service
| Film type |
Thickness |
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5 |
6 |
8 |
12 |
| Thermal oxide films (THOX®) |
20 nm―2.5 µm |
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| Super thin thermal oxide films (THOX®) |
Up to 20 µm |
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| PE-CVD TEOS |
100nm―1.5 µm |
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| LP-CVD |
50 nm―300 nm |
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| PE-CVD |
100 nm―1.2 µm |
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| BPSG/PSG |
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| Poly-Si (Non-Dope) |
50 nm―500 nm |
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| AP-CVD oxide |
100 nm―800 nm |
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| EPI |
1 µm―20 µm |
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| Al |
100 nm―500 nm |
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| Al-Si |
100 nm―500 nm |
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| Al-Si-Cu |
100 nm―500 nm |
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| Al-Cu |
100 nm―500 nm |
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| Ti |
100 nm―500 nm |
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| TiN |
100 nm―500 nm |
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| Ta |
100 nm―500 nm |
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| TaN |
100 nm―500 nm |
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| W-Si (CVD) |
100 nm―500 nm |
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| Cu |
100 nm―500 nm |
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| Au |
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| Resist |
100 nm―3 µm |
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| Pattern processing |
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| Ion implantation |
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| Polyimide |
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| Wafer reclaim |
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| SOG |
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